Artech House, 2010. — 591 p. — ISBN13: 978-1-60783-983-5.
The target audience of this book are mainly test engineers working on design verification, characterization, and production testing of multigigabit I/O interfaces. However, the book provides a general overview over the
challenges these test engineers face in their daily work with high-speed devices that can be helpful also for chip designers and product engineers to
minimize these challenges using appropriate DfT and device test strategies to ensure sufficient device quality with less test implementation effort.