Springer, 2016. — 698 p. — ISBN10: 3662527162.
Provides a comprehensive overview of cutting-edge IR/UV detector technologies
Reviews the new technologies related to third-generation IR detectors
Describes key fabrication techniques such as material epitaxy, chip processing and readout circuits design of IR/UV detectors
This book introduces the basic framework of advanced focal plane technology based on the third-generation infrared focal plane concept. The essential concept, research advances, and future trends in advanced sensor arrays are comprehensively reviewed. Moreover, the book summarizes recent research advances in HgCdTe/AlGaN detectors for the infrared/ultraviolet waveband, with a particular focus on the numerical method of detector design, material epitaxial growth and processing, as well as Complementary Metal-Oxide-Semiconductor Transistor readout circuits. The book offers a unique resource for all graduate students and researchers interested in the technologies of focal plane arrays or electro-optical imaging sensors.
Fundamentals of Focal Plane Arrays
Design Methods for HgCdTe Infrared Detectors
CdTe/Si Composite Substrate and HgCdTe Epitaxy
AlGaN Epitaxial Technology
HgCdTe Detector Chip Technology
Chip Technique of AlGaN Focal Plane Arrays
Readout Integrated Circuit, Measurement, and Testing Technology for Advanced Focal Plane Array